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[IEEE 2002 International Test Conference - Baltimore, MD, USA (7-10 Oct. 2002)] Proceedings. International Test Conference - On-line testing of multi-source noise-induced errors on the interconnects and buses of system-on-chips

✍ Scribed by Yi Zhao, ; Li Chen, ; Dey, S.

Book ID: 120643287
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 631 KB
Category: Article
ISBN-13: 9780780375420
DOI: 10.1109/TEST.2002.1041799

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