[IEEE 2002 International Test Conference - Baltimore, MD, USA (7-10 Oct. 2002)] Proceedings. International Test Conference - Optimal core wrapper width selection and SOC test scheduling based on 3-D bin packing algorithm

✍ Scribed by Yu Huang, ; Reddy, S.M.; Wu-Tung Cheng, ; Reuter, P.; Mukherjee, N.; Chien-Chung Tsai, ; Samman, O.; Zaidan, Y.

• Book ID: 121645958
• Publisher: IEEE
• Year: 2002
• Tongue: English
• Weight: 546 KB
• Category: Article
• ISBN-13: 9780780375420
• DOI: 10.1109/TEST.2002.1041747