✦ LIBER ✦

[IEEE 2002 International Test Conference - Baltimore, MD, USA (7-10 Oct. 2002)] Proceedings. International Test Conference - Test resource optimization for multi-site testing of SOCs under ATE memory depth constraints

✍ Scribed by Iyengar, V.; Goel, S.K.; Marinissen, E.J.; Chakrabarty, K.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2002 International Test Conference

✍ Toutounchi, S.; Lai, A. 📂 Article 📅 2002 🏛 IEEE 🌐 English ⚖ 530 KB

[IEEE 2002 International Test Conference

✍ Dorsch, R.; Rivera, R.H.; Wunderlich, H.J.; Fischer, M. 📂 Article 📅 2002 🏛 IEEE 🌐 English ⚖ 458 KB

[IEEE 2002 International Test Conference

✍ Zorian, Y. 📂 Article 📅 2002 🏛 IEEE 🌐 English ⚖ 721 KB

[IEEE 2002 International Test Conference

✍ Dupont, E.; Nicolaidis, M. 📂 Article 📅 2002 🏛 IEEE 🌐 English ⚖ 464 KB

[IEEE 2002 International Test Conference

✍ Volkerink, E.H.; Khoche, A.; Mitra, S. 📂 Article 📅 2002 🏛 IEEE 🌐 English ⚖ 672 KB

[IEEE 2002 International Test Conference

✍ Nahvi, M.; Ivanov, A.; Saleh, R. 📂 Article 📅 2002 🏛 IEEE 🌐 English ⚖ 480 KB