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[IEEE 2002 International Test Conference - Baltimore, MD, USA (7-10 Oct. 2002)] Proceedings. International Test Conference - FPGA test and coverage

✍ Scribed by Toutounchi, S.; Lai, A.

Book ID: 126678453
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 530 KB
Category: Article
ISBN-13: 9780780375420
DOI: 10.1109/TEST.2002.1041811

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