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[IEEE 2002 International Test Conference - Baltimore, MD, USA (7-10 Oct. 2002)] Proceedings. International Test Conference - Integrating DFT in the physical synthesis flow

✍ Scribed by Guiller, L.; Neuveux, F.; Duggirala, S.; Chandramouli, R.; Kapur, R.

No coin nor oath required. For personal study only.

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