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[IEEE 2002 International Test Conference - Baltimore, MD, USA (7-10 Oct. 2002)] Proceedings. International Test Conference - Jitter testing for multi-Gigabit backplane SerDes - techniques to decompose and combine various types of jitter

โœ Scribed by Cai, Y.; Werner, S.A.; Zhang, G.J.; Olsen, M.J.; Brink, R.D.


Book ID
111916256
Publisher
IEEE
Year
2002
Tongue
English
Weight
514 KB
Volume
0
Category
Article
ISBN-13
9780780375420

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