[IEEE 2002 International Test Conference - Baltimore, MD, USA (7-10 Oct. 2002)] Proceedings. International Test Conference - X-compact: an efficient response compaction technique for test cost reduction

✍ Scribed by Mitra, S.; Kee Sup Kim,

• Book ID: 118213824
• Publisher: IEEE
• Year: 2002
• Tongue: English
• Weight: 650 KB
• Volume: 0
• Category: Article
• ISBN-13: 9780780375420
• DOI: 10.1109/test.2002.1041774