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[IEEE 2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings - Sinaia, Romania (10-14 Oct. 2000)] 2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings (Cat. No.00TH8486) - Influence of the N+ floating emitter on the on-state characteristics of the Trench EST

✍ Scribed by Spulber, O.; Sweet, M.; Vershinin, K.; Ngw, Y.; Ngwendson, L.; Bose, S.C.; De Souza, M.M.; Narayanan, E.M.S.

Book ID: 124101642
Publisher: IEEE
Year: 2000
Weight: 335 KB
Edition: 2000
Volume: 1
Category: Article
ISBN-13: 9780780358850
DOI: 10.1109/SMICND.2000.890247

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