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[IEEE 2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings - Sinaia, Romania (10-14 Oct. 2000)] 2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings (Cat. No.00TH8486) - Threshold voltage extraction methods for MOS transistors

✍ Scribed by Dobrescu, L.; Petrov, M.; Dobrescu, D.; Ravariu, C.

Book ID: 118172912
Publisher: IEEE
Year: 2000
Weight: 285 KB
Edition: 2000
Volume: 1
Category: Article
ISBN-13: 9780780358850
DOI: 10.1109/smicnd.2000.890257

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