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[IEEE 2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings - Sinaia, Romania (10-14 Oct. 2000)] 2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings (Cat. No.00TH8486) - XPS study of gas sensitive SnO/sub 2/ thin films

✍ Scribed by Brinzari, V.; Korotchenkov, G.; Veltruska, K.; Matolin, V.; Tsud, N.; Schwank, J.

Book ID: 120969370
Publisher: IEEE
Year: 2000
Weight: 356 KB
Edition: 2000
Volume: 1
Category: Article
ISBN-13: 9780780358850
DOI: 10.1109/SMICND.2000.890202

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