𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings - Sinaia, Romania (10-14 Oct. 2000)] 2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings (Cat. No.00TH8486) - Yb impurity influence on parameters of PbTe crystals grown from the melt

✍ Scribed by Beshlin, V.; Lungu, L.; Nicoric, A.; Nicorici, V.

Book ID: 120970724
Publisher: IEEE
Year: 2000
Weight: 223 KB
Edition: 2000
Volume: 1
Category: Article
ISBN-13: 9780780358850
DOI: 10.1109/SMICND.2000.890203

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2000 International Semiconductor C

[IEEE 2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings - Sinaia, Romania (10-14 Oct. 2000)] 2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings (Cat. No.00TH8486) - Threshold voltage extraction methods for MOS transistors

✍ Dobrescu, L.; Petrov, M.; Dobrescu, D.; Ravariu, C. 📂 Article 📅 2000 🏛 IEEE ⚖ 285 KB

[IEEE 2000 International Semiconductor C

[IEEE 2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings - Sinaia, Romania (10-14 Oct. 2000)] 2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings (Cat. No.00TH8486) - Temperature effect on photoluminescence excitation process of porous silicon

✍ Korsunskaya, N.E.; Torchinskaya, T.V.; Dzhumaev, B.R.; Khomenkova, I.Yu.; Bulakh 📂 Article 📅 2000 🏛 IEEE ⚖ 206 KB

[IEEE 2000 International Semiconductor C

[IEEE 2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings - Sinaia, Romania (10-14 Oct. 2000)] 2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings (Cat. No.00TH8486) - Reviews and prospects of high-density RAM technology

✍ Itoh, K.; Watanabe, T.; Kimura, S.; Sakata, T. 📂 Article 📅 2000 🏛 IEEE ⚖ 904 KB

[IEEE 2000 International Semiconductor C

[IEEE 2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings - Sinaia, Romania (10-14 Oct. 2000)] 2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings (Cat. No.00TH8486) - XPS study of gas sensitive SnO/sub 2/ thin films

✍ Brinzari, V.; Korotchenkov, G.; Veltruska, K.; Matolin, V.; Tsud, N.; Schwank, J 📂 Article 📅 2000 🏛 IEEE ⚖ 356 KB

[IEEE 2000 International Semiconductor C

[IEEE 2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings - Sinaia, Romania (10-14 Oct. 2000)] 2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings (Cat. No.00TH8486) - A novel, clustered insulated gate bipolar transistor for high power applications

✍ Sankara Narayanan, E.M.; Sweet, M.R.; Luther-King, N.; Vershinin, K.; Spulber, O 📂 Article 📅 2000 🏛 IEEE ⚖ 512 KB

[IEEE 2000 International Semiconductor C

[IEEE 2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings - Sinaia, Romania (10-14 Oct. 2000)] 2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings (Cat. No.00TH8486) - Influence of the N+ floating emitter on the on-state characteristics of the Trench EST

✍ Spulber, O.; Sweet, M.; Vershinin, K.; Ngw, Y.; Ngwendson, L.; Bose, S.C.; De So 📂 Article 📅 2000 🏛 IEEE ⚖ 335 KB