𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual - San Jose, CA, USA (10-13 April 2000)] 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059) - Lifetime prediction of IGBT modules for traction applications

✍ Scribed by Ciappa, M.; Fichtner, W.

Book ID: 121657918
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 659 KB
Edition: 38
Category: Article
ISBN-13: 9780780358607
DOI: 10.1109/RELPHY.2000.843917

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2000 IEEE International Reliabilit

[IEEE 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual - San Jose, CA, USA (10-13 April 2000)] 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059) - Reliability assessment through defect based testing

✍ Lisenker, B.; Mitnick, Y. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 587 KB

[IEEE 2000 IEEE International Reliabilit

[IEEE 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual - San Jose, CA, USA (10-13 April 2000)] 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059) - Effect of W coating on microengine performance

✍ Mani, S.S.; Fleming, J.G.; Walraven, J.A.; Sniegowski, J.J.; se Beer, M.P.; Irwi 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 760 KB

[IEEE 2000 IEEE International Reliabilit

[IEEE 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual - San Jose, CA, USA (10-13 April 2000)] 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059) - Hot carrier induced degradation in deep submicron MOSFETs at 100°C

✍ Li, E.; Rosenbaum, E.; Register, L.F.; Tao, J.; Fang, P. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 385 KB

[IEEE 2000 IEEE International Reliabilit

[IEEE 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual - San Jose, CA, USA (10-13 April 2000)] 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059) - Early stage hot carrier degradation of state-of-the-art LDD N-MOSFETs

✍ Manhas, S.K.; de Souza, M.M.; Gates, A.S.; Chetlur, S.C.; Sankara Narayanan, E.M 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 355 KB

[IEEE 2001 IEEE International Reliabilit

[IEEE 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual - Orlando, FL, USA (30 April-3 May 2001)] 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) - Design and analysis of new protection structures for smart power technology with controlled trigger and holding voltage

✍ De Heyn, V.; Groeseneken, G.; Keppens, B.; Natarajan, M.; Vacaresse, L.; Gallopy 📂 Article 📅 2001 🏛 IEEE ⚖ 711 KB

[IEEE 46th International Symposium on Re

[IEEE 46th International Symposium on Reliability and Maintainability - Product Quality and Integrity - Los Angeles, CA, USA (24-27 Jan. 2000)] Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055) - Reliability allocation and optimization for complex systems

✍ Mettas, A. 📂 Article 📅 2000 🏛 IEEE ⚖ 642 KB