[IEEE 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual - Orlando, FL, USA (30 April-3 May 2001)] 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) - Design and analysis of new protection structures for smart power technology with controlled trigger and holding voltage

✍ Scribed by De Heyn, V.; Groeseneken, G.; Keppens, B.; Natarajan, M.; Vacaresse, L.; Gallopyn, G.

• Book ID: 118162522
• Publisher: IEEE
• Year: 2001
• Weight: 711 KB
• Volume: 0
• Category: Article
• ISBN-13: 9780780365872
• DOI: 10.1109/relphy.2001.922910