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[IEEE 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual - San Diego, CA, USA (23-25 March 1999)] 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) - A new physical model for NVM data-retention time-to-failure

✍ Scribed by De Salvo, B.; Ghibaudo, G.; Pananakakis, G.; Guillaumot, B.; Candelier, P.; Reimbold, G.

Book ID: 126738512
Publisher: IEEE
Year: 1999
Weight: 386 KB
Category: Article
ISBN-13: 9780780352209
DOI: 10.1109/RELPHY.1999.761586

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