[IEEE 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual - San Diego, CA, USA (23-25 March 1999)] 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) - Fault model for VLSI circuits reliability assessment

✍ Scribed by Lisenker, B.; Mitnick, Y.

• Book ID: 118015355
• Publisher: IEEE
• Year: 1999
• Tongue: English
• Weight: 645 KB
• Edition: 37
• Volume: 0
• Category: Article
• ISBN-13: 9780780352209
• DOI: 10.1109/relphy.1999.761633