𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual - San Diego, CA, USA (23-25 March 1999)] 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) - A unified gate oxide reliability model

✍ Scribed by Chenming Hu, ; Qiang Lu,

Book ID: 121825960
Publisher: IEEE
Year: 1999
Tongue: English
Weight: 369 KB
Edition: 37
Category: Article
ISBN-13: 9780780352209
DOI: 10.1109/RELPHY.1999.761591

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 1999 IEEE International Reliabilit

[IEEE 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual - San Diego, CA, USA (23-25 March 1999)] 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) - Fault model for VLSI circuits reliability assessment

✍ Lisenker, B.; Mitnick, Y. 📂 Article 📅 1999 🏛 IEEE 🌐 English ⚖ 645 KB

[IEEE 1999 IEEE International Reliabilit

[IEEE 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual - San Diego, CA, USA (23-25 March 1999)] 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) - Trap-assisted tunneling current through ultra-thin oxide

✍ Wu, J.; Register, L.F.; Rosenbaum, E. 📂 Article 📅 1999 🏛 IEEE 🌐 English ⚖ 555 KB

[IEEE 1999 IEEE International Reliabilit

[IEEE 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual - San Diego, CA, USA (23-25 March 1999)] 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) - A new physical model for NVM data-retention time-to-failure

✍ De Salvo, B.; Ghibaudo, G.; Pananakakis, G.; Guillaumot, B.; Candelier, P.; Reim 📂 Article 📅 1999 🏛 IEEE ⚖ 386 KB

[IEEE 1999 IEEE International Reliabilit

[IEEE 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual - San Diego, CA, USA (23-25 March 1999)] 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) - A novel fast technique for detecting voiding damage in IC interconnects

✍ Foley, S.; Floyd, L.; Mathewson, A. 📂 Article 📅 1999 🏛 IEEE ⚖ 740 KB

[IEEE 1999 IEEE International Reliabilit

[IEEE 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual - San Diego, CA, USA (23-25 March 1999)] 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) - Backside probing of flip-chip circuits using electrostatic force sampling

✍ Qi, R.; Thomson, D.J.; Bridges, G.E. 📂 Article 📅 1999 🏛 IEEE ⚖ 556 KB

[IEEE 1999 IEEE International Reliabilit

[IEEE 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual - San Diego, CA, USA (23-25 March 1999)] 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) - A model for channel hot carrier reliability degradation due to plasma damage in MOS devices

✍ Rangan, S.; Krishnan, S.; Amerasekara, A.; Aur, S.; Ashok, S. 📂 Article 📅 1999 🏛 IEEE ⚖ 394 KB