𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Denver, CO, USA (8-10 April 1997)] 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Using I/sub DDQ/ drift testing to detect hydrogen in MOS devices

✍ Scribed by Sabin, E.; Nagalingam, S.; Lemke, S.

Book ID: 126600709
Publisher: IEEE
Year: 1997
Weight: 773 KB
Category: Article
ISBN-13: 9780780335752
DOI: 10.1109/RELPHY.1997.584237

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 1997 IEEE International Reliabilit

[IEEE 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Denver, CO, USA (8-10 April 1997)] 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Short-timescale thermal mapping of interconnects

✍ Yongho Sungtaek Ju, ; Goodson, K.E. 📂 Article 📅 1997 🏛 IEEE ⚖ 643 KB

[IEEE 1997 IEEE International Reliabilit

[IEEE 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Denver, CO, USA (8-10 April 1997)] 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Temperature cycling and thermal shock failure rate modeling

✍ Blish, R.C. 📂 Article 📅 1997 🏛 IEEE ⚖ 889 KB

[IEEE 1997 IEEE International Reliabilit

[IEEE 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Denver, CO, USA (8-10 April 1997)] 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Accelerated gate-oxide breakdown in mixed-voltage I/O circuits

✍ Furukawa, T.; Turner, D.; Mittl, S.; Maloney, M.; Serafin, R.; Clark, W.; Bialas 📂 Article 📅 1997 🏛 IEEE ⚖ 520 KB

[IEEE 1997 IEEE International Reliabilit

[IEEE 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Denver, CO, USA (8-10 April 1997)] 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Emerging role of semiconductor process equipment to overcome device failure mechanisms

✍ Sinha, A.K.; Moghadam, F.; Mosley, R.; Chang, M.; Ellwanger, R. 📂 Article 📅 1997 🏛 IEEE ⚖ 948 KB

[IEEE 1997 IEEE International Reliabilit

[IEEE 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Denver, CO, USA (8-10 April 1997)] 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Towards a nondestructive procedure for characterization of molding compounds

✍ Canumalla, S.; Kessler, L.W. 📂 Article 📅 1997 🏛 IEEE ⚖ 630 KB

[IEEE 1997 IEEE International Reliabilit

[IEEE 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Denver, CO, USA (8-10 April 1997)] 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Life tests and failure mechanisms of GaN/AlGaN/InGaN light emitting diodes

✍ Barton, D.L.; Osinski, M.; Perlin, P.; Helms, C.J.; Berg, N.H. 📂 Article 📅 1997 🏛 IEEE ⚖ 622 KB