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[IEEE 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Denver, CO, USA (8-10 April 1997)] 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Life tests and failure mechanisms of GaN/AlGaN/InGaN light emitting diodes

✍ Scribed by Barton, D.L.; Osinski, M.; Perlin, P.; Helms, C.J.; Berg, N.H.

Book ID: 120535465
Publisher: IEEE
Year: 1997
Weight: 622 KB
Category: Article
ISBN-13: 9780780335752
DOI: 10.1109/RELPHY.1997.584273

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