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[IEEE 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Denver, CO, USA (8-10 April 1997)] 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Accelerated gate-oxide breakdown in mixed-voltage I/O circuits

✍ Scribed by Furukawa, T.; Turner, D.; Mittl, S.; Maloney, M.; Serafin, R.; Clark, W.; Bialas, J.; Longenbach, L.; Howard, J.

Book ID: 126594838
Publisher: IEEE
Year: 1997
Weight: 520 KB
Category: Article
ISBN-13: 9780780335752
DOI: 10.1109/RELPHY.1997.584255

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