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[IEEE 1997 IEEE Hong Kong Electron Devices Meeting - Hong Kong (30 Aug. 1997)] 1997 IEEE Hong Kong Proceedings Electron Devices Meeting - Extraction of the threshold voltage of MOSFETs: an overview

✍ Scribed by Liou, J.J.; Ortiz-Condez, A.; Sanchez, F.G.

Book ID: 121287702
Publisher: IEEE
Year: 1997
Weight: 506 KB
Edition: 1997
Category: Article
ISBN-13: 9780780338029
DOI: 10.1109/HKEDM.1997.642325

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