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[IEEE 1997 2nd International Workshop on Statistical Metrology - Kyoto, Japan (8 June 1997)] 1997 2nd International Workshop on Statistical Metrology - Quick characterization of statistical variations and sensitivity for speed and power consumption within a wafer of sub-micron CMOS

✍ Scribed by Lee, M.M.-O.; Asada, K.

Book ID: 126670760
Publisher: IEEE
Year: 1997
Weight: 569 KB
Category: Article
ISBN-13: 9780780337374
DOI: 10.1109/IWSTM.1997.629424

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