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[IEEE 1997 2nd International Workshop on Statistical Metrology - Kyoto, Japan (8 June 1997)] 1997 2nd International Workshop on Statistical Metrology - Validation of saturation velocity lowering in inversion layer of MOSFET's

✍ Scribed by Shigyo, N.; Shimane, T.; Enda, T.; Fukuda, S.; Suda, M.; Kokubun, K.

Book ID: 126743325
Publisher: IEEE
Year: 1997
Weight: 259 KB
Category: Article
ISBN-13: 9780780337374
DOI: 10.1109/IWSTM.1997.629423

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