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[IEEE 1994 IEEE International SOI Conference - Nantucket, MA, USA (3-6 Oct. 1994)] Proceedings. IEEE International SOI Conference - On buried-oxide effects in SOI lateral bipolar transistors

โœ Scribed by Banna, S.R.; Chan, P.C.H.; Ko, P.K.


Book ID
126685102
Publisher
IEEE
Year
1994
Weight
160 KB
Category
Article
ISBN-13
9780780324077

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