✦ LIBER ✦

[IEEE 1994 IEEE International SOI Conference - Nantucket, MA, USA (3-6 Oct. 1994)] Proceedings. IEEE International SOI Conference - Moat edge oriented defects and buried oxide leakage in SIMOX integrated circuits

✍ Scribed by Brown, G.A.; Jenkins, W.C.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 1994 IEEE International SOI Confer

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