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[IEEE 1994 IEEE International SOI Conference - Nantucket, MA, USA (3-6 Oct. 1994)] Proceedings. IEEE International SOI Conference - Measurement of SOI MOSFET I-V characteristics without self-heating

✍ Scribed by Jenkins, K.A.; Sun, J.Y.-C.; Pelloie, J.-L.

Book ID: 118125902
Publisher: IEEE
Year: 1994
Tongue: English
Weight: 146 KB
Volume: 0
Category: Article
ISBN-13: 9780780324077
DOI: 10.1109/soi.1994.514276

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