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[IEEE 1994 IEEE International SOI Conference - Nantucket, MA, USA (3-6 Oct. 1994)] Proceedings. IEEE International SOI Conference - A new parameter extraction method for ultra-thin oxide SOI MOSFET's

✍ Scribed by Faynot, O.; Cristoloveanu, S.; McLarty, P.; Raynaud, C.; Gautier, J.

Book ID: 126667952
Publisher: IEEE
Year: 1994
Weight: 139 KB
Category: Article
ISBN-13: 9780780324077
DOI: 10.1109/SOI.1994.514207

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