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[IEEE 12th IEEE International On-Line Testing Symposium (IOLTS'06) - Como, Italy (10-12 July 2006)] 12th IEEE International On-Line Testing Symposium (IOLTS'06) - Evaluating One-Hot Encoding Finite State Machines for SEU Reliability in SRAM-based FPGAs

✍ Scribed by Cassel, M.; Kastensmidt, F.L.

Book ID: 126490842
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 309 KB
Category: Article
ISBN-13: 9780769526201
DOI: 10.1109/IOLTS.2006.32

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