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[IEEE 12th IEEE International On-Line Testing Symposium (IOLTS'06) - Como, Italy (10-12 July 2006)] 12th IEEE International On-Line Testing Symposium (IOLTS'06) - On-line Fault Detection and Location for NoC Interconnects

✍ Scribed by Grecu, C.; Ivanov, A.; Saleh, R.; Sogomonyan, E.S.; Pande, P.P.

Book ID: 118183264
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 332 KB
Volume: 0
Category: Article
ISBN-13: 9780769526201
DOI: 10.1109/iolts.2006.44

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