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[IEEE 12th IEEE International On-Line Testing Symposium (IOLTS'06) - Como, Italy (10-12 July 2006)] 12th IEEE International On-Line Testing Symposium (IOLTS'06) - A Low-Cost Single-Event Latchup Mitigation Sscheme

✍ Scribed by Nicolaidis, M.

Book ID: 126312719
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 277 KB
Category: Article
ISBN-13: 9780769526201
DOI: 10.1109/IOLTS.2006.6

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