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[IEEE 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Chania (2013.7.8-2013.7.10)] 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - A low-cost input vector monitoring concurrent BIST scheme

✍ Scribed by Voyiatzis, I.; Efstathiou, C.; Sgouropoulou, C.

Book ID: 125503374
Publisher: IEEE
Year: 2013
Weight: 102 KB
Category: Article
ISBN: 1479906646
DOI: 10.1109/IOLTS.2013.6604074

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