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[IEEE 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Chania (2013.7.8-2013.7.10)] 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - A post-deployment IC trust evaluation architecture

✍ Scribed by Jin, Yier; Maliuk, Dzmitry; Makris, Yiorgos

Book ID: 121237009
Publisher: IEEE
Year: 2013
Weight: 252 KB
Category: Article
ISBN: 1479906646
DOI: 10.1109/IOLTS.2013.6604083

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