𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Comput. Soc 10th IEEE International On-Line Testing Symposium - Funchal, Madeira Island, Portugal (12-14 July 2004)] Proceedings. 10th IEEE International On-Line Testing Symposium - On the evaluation of SEU sensitiveness in SRAM-based FPGAs

✍ Scribed by Bernardi, P.; Reorda, M.S.; Sterpone, L.; Violante, M.

Book ID: 118186389
Publisher: IEEE Comput. Soc
Year: 2004
Weight: 276 KB
Volume: 0
Category: Article
ISBN-13: 9780769521800
DOI: 10.1109/olt.2004.1319668

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Comput. Soc 10th IEEE Internationa

[IEEE Comput. Soc 10th IEEE International On-Line Testing Symposium - Funchal, Madeira Island, Portugal (12-14 July 2004)] Proceedings. 10th IEEE International On-Line Testing Symposium - Fault tolerant mechatronics [automotive applications]

✍ Dilger, E.; Karrelmeyer, R.; Straube, B. 📂 Article 📅 2004 🏛 IEEE Comput. Soc ⚖ 803 KB

[IEEE Comput. Soc 10th IEEE Internationa

[IEEE Comput. Soc 10th IEEE International On-Line Testing Symposium - Funchal, Madeira Island, Portugal (12-14 July 2004)] Proceedings. 10th IEEE International On-Line Testing Symposium - New high speed CMOS self-checking voter

✍ Cazeaux, J.M.; Rossi, D.; Metra, C. 📂 Article 📅 2004 🏛 IEEE Comput. Soc ⚖ 339 KB

[IEEE Comput. Soc 10th IEEE Internationa

[IEEE Comput. Soc 10th IEEE International On-Line Testing Symposium - Funchal, Madeira Island, Portugal (12-14 July 2004)] Proceedings. 10th IEEE International On-Line Testing Symposium - A novel fault tolerant cache to improve yield in nanometer technologies

✍ Agarwal, A.; Paul, B.C.; Roy, K. 📂 Article 📅 2004 🏛 IEEE Comput. Soc ⚖ 367 KB

[IEEE Comput. Soc 10th IEEE Internationa

[IEEE Comput. Soc 10th IEEE International On-Line Testing Symposium - Funchal, Madeira Island, Portugal (12-14 July 2004)] Proceedings. 10th IEEE International On-Line Testing Symposium - Fault detection enhancement in cache memories using a high performance placement algorithm

✍ Zarandi, H.R.; Miremadi, S.G.; Sarbazi-Azad, H. 📂 Article 📅 2004 🏛 IEEE Comput. Soc ⚖ 319 KB

[IEEE 12th IEEE International On-Line Te

[IEEE 12th IEEE International On-Line Testing Symposium (IOLTS'06) - Como, Italy (10-12 July 2006)] 12th IEEE International On-Line Testing Symposium (IOLTS'06) - Evaluating SEU and Crosstalk Effects in Network-on-Chip Routers

✍ Frantz, A.P.; Carro, L.; Cota, E.; Kastensmidt, F.L. 📂 Article 📅 2006 🏛 IEEE ⚖ 147 KB

[IEEE 12th IEEE International On-Line Te

[IEEE 12th IEEE International On-Line Testing Symposium (IOLTS'06) - Como, Italy (10-12 July 2006)] 12th IEEE International On-Line Testing Symposium (IOLTS'06) - Fault Tolerance Implementation within SRAM Based FPGA Design Based upon the Increased Level of Single Event Upset Susceptibility

✍ Berg, M. 📂 Article 📅 2006 🏛 IEEE ⚖ 178 KB