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[IEEE Comput. Soc 10th IEEE International On-Line Testing Symposium - Funchal, Madeira Island, Portugal (12-14 July 2004)] Proceedings. 10th IEEE International On-Line Testing Symposium - A novel fault tolerant cache to improve yield in nanometer technologies

✍ Scribed by Agarwal, A.; Paul, B.C.; Roy, K.

Book ID: 118039855
Publisher: IEEE Comput. Soc
Year: 2004
Weight: 367 KB
Volume: 0
Category: Article
ISBN-13: 9780769521800
DOI: 10.1109/olt.2004.1319673

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