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Identifying invalid states for sequential circuit test generation

✍ Scribed by Hsing-Chung Liang; Chung Len Lee; Chen, J.E.

Book ID: 119778231
Publisher: IEEE
Year: 1997
Tongue: English
Weight: 224 KB
Volume: 16
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.658570

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