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Dynamic state traversal for sequential circuit test generation

✍ Scribed by Hsiao, Michael S.; Rudnick, Elizabeth M.; Patel, Janak H.

Book ID: 121231596
Publisher: Association for Computing Machinery
Year: 2000
Tongue: English
Weight: 135 KB
Volume: 5
Category: Article
ISSN: 1084-4309
DOI: 10.1145/348019.348288

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