๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

High-Voltage-Tolerant ESD Clamp Circuit With Low Standby Leakage in Nanoscale CMOS Process

โœ Scribed by Ming-Dou Ker; Chun-Yu Lin


Book ID
114620016
Publisher
IEEE
Year
2010
Tongue
English
Weight
938 KB
Volume
57
Category
Article
ISSN
0018-9383

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES