✦ LIBER ✦
Low leakage 3×VDD-tolerant ESD detection circuit without deep N-well in a standard 90-nm low-voltage CMOS process
✍ Scribed by ZhaoNian Yang, HongXia Liu, ShuLong Wang
- Book ID
- 120799461
- Publisher
- SP Science China Press
- Year
- 2013
- Tongue
- English
- Weight
- 649 KB
- Volume
- 56
- Category
- Article
- ISSN
- 1006-9321
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