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High temperature reliability and interfacial reaction of eutectic Sn–0.7Cu/Ni solder joints during isothermal aging

✍ Scribed by Jeong-Won Yoon; Seung-Boo Jung


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
950 KB
Volume
46
Category
Article
ISSN
0026-2714

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