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High-resolution X-ray diffraction studies of combinatorial epitaxial Ge (0 0 1) thin-films on Ge (0 0 1) substrates

✍ Scribed by Yuncheng Zhong; Yong S. Chu; Brian A. Collins; Frank Tsui

Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 308 KB
Volume: 254
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2007.05.088

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High-resolution X-ray diffraction studies of combinatorial epitaxial Ge (0&#xa0;0&#xa0;1) thin-films on Ge (0&#xa0;0&#xa0;1) substrates

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