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High-resolution X-ray diffraction investigations of epitaxially grown ZnSe/GaAs layers

✍ Scribed by Wolf, K; Jilka, S; Rosenauer, A; Schutz, G; Stanzl, H; Reisinger, T; Gebhardt, W

Book ID: 125476359
Publisher: Institute of Physics
Year: 1995
Tongue: English
Weight: 437 KB
Volume: 28
Category: Article
ISSN: 0022-3727
DOI: 10.1088/0022-3727/28/4a/023

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