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High-resolution X-ray diffraction by end of range defects in self-amorphized Ge

✍ Scribed by G. Bisognin; S. Vangelista; E. Bruno

Book ID: 108215584
Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 355 KB
Volume: 154-155
Category: Article
ISSN: 0921-5107
DOI: 10.1016/j.mseb.2008.08.002

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