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Characterization of optical waveguide layers in LiNbO3 by high-resolution X-ray diffraction

✍ Scribed by E. Zolotoyabko; Y. Avrahami


Book ID
119125510
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
470 KB
Volume
24
Category
Article
ISSN
0167-577X

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## Abstract A high resolution X‐ray diffraction method has been effectively used for the structural characterization of InP porous layers. It was revealed that strong diffuse scattering from pores around reciprocal lattice points does depend on the azimuth positions of samples. To extract structura