𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Characterization of CdTe/Hg1−xCdxTe heterostructures by high-resolution x-ray diffraction

✍ Scribed by N. Mainzer; D. Shilo; E. Zolotoyabko; G. Bahir; A. Sher


Book ID
107457562
Publisher
Springer US
Year
1997
Tongue
English
Weight
406 KB
Volume
26
Category
Article
ISSN
0361-5235

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES


Characterization of InP porous layer by
✍ Punegov, V. I. ;Lomov, A. A. ;Shcherbachev, K. D. 📂 Article 📅 2007 🏛 John Wiley and Sons 🌐 English ⚖ 502 KB

## Abstract A high resolution X‐ray diffraction method has been effectively used for the structural characterization of InP porous layers. It was revealed that strong diffuse scattering from pores around reciprocal lattice points does depend on the azimuth positions of samples. To extract structura

High resolution X-ray diffraction analys
✍ Matyi, R. J. ;Jamil, M. ;Shahedipour-Sandvik, F. 📂 Article 📅 2007 🏛 John Wiley and Sons 🌐 English ⚖ 478 KB

## Abstract High resolution triple‐axis X‐ray diffraction has been used to characterize the effects of nitrogen ion implantation into thin (15 nm and 55 nm) AlN buffer layers on the resultant structural quality of nominally 2 μm epitaxial GaN layers grown on silicon substrates. The GaN symmetric (0