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High-Resolution Electron Microscopy Investigation of Viscous Flow Creep in a High-Purity Silicon Nitride

✍ Scribed by Qiang Jin; David S. Wilkinson; George C. Weatherly

Book ID: 110827802
Publisher: John Wiley and Sons
Year: 2004
Tongue: English
Weight: 986 KB
Volume: 82
Category: Article
ISSN: 0002-7820
DOI: 10.1111/j.1151-2916.1999.tb01946.x

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