High-level test generation and built-in self-test techniques for digital systems
โ Scribed by Gert Jervan.
- Tongue
- English
- Leaves
- 112
- Category
- Library
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
<p>This book covers state-of-the art techniques for high-level modeling and validation of complex hardware/software systems, including those with multicore architectures. Readers will learn to avoid time-consuming and error-prone validation from the comprehensive coverage of system-level validation,
This is a true cutting-edge circuit design from industry which may lead to corporate relationship with Mentor Graphics. It is a book for professionals which has some small usage as a grad level text. It clusters well with many recent and upcoming titles in the heart of my signing target area. The MS
<p>This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, compu