Built-in-Self-Test and Digital Self-Calibration for RF SoCs

✍ Scribed by Sleiman Bou-Sleiman, Mohammed Ismail (auth.)

Publisher: Springer-Verlag New York
Year: 2012
Tongue: English
Leaves: 105
Series: SpringerBriefs in Electrical and Computer Engineering
Edition: 1
Category: Library

No coin nor oath required. For personal study only.

✦ Synopsis

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.

✦ Table of Contents

Front Matter....Pages i-xvii
Introduction and Motivation....Pages 1-12
Radio Systems Overview: Architecture, Performance, and Built-in-Test....Pages 13-34
Efficient Testing for RF SoCs....Pages 35-55
RF Built-in-Self-Test....Pages 57-71
RF Built-in-Self-Calibration....Pages 73-86
Conclusions....Pages 87-89

✦ Subjects

Circuits and Systems;Signal, Image and Speech Processing;Electronic Circuits and Devices

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