Hybrid built-in self-test and test generation techniques for digital systems
โ Scribed by Gert Jervan.
- Tongue
- English
- Leaves
- 255
- Category
- Library
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
This is a true cutting-edge circuit design from industry which may lead to corporate relationship with Mentor Graphics. It is a book for professionals which has some small usage as a grad level text. It clusters well with many recent and upcoming titles in the heart of my signing target area. The MS
<p>This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, compu
<p><em>Analog Signal Generation for Built-In-Self-Test (BIST) of</em><em>Mixed-Signal Integrated Circuits</em> is a concise introduction to a powerful new signal generation technique. <br/> The book begins with a brief introduction to the testing problem and a review of conventional signal generatio