✦ LIBER ✦

High-level test compaction techniques

✍ Scribed by Ravi, S.; Lakshminarayana, G.; Jha, N.K.

Book ID: 118698268
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 687 KB
Volume: 21
Category: Article
ISSN: 0278-0070
DOI: 10.1109/tcad.2002.1013895

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