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Efficient techniques for dynamic test sequence compaction

✍ Scribed by Rudnick, E.M.; Patel, J.H.

Book ID: 119772965
Publisher: IEEE
Year: 1999
Tongue: English
Weight: 211 KB
Volume: 48
Category: Article
ISSN: 0018-9340
DOI: 10.1109/12.754998

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## Abstract Test sequences for acyclic sequential circuits can be generated by using a time expansion model. In this paper, static and dynamic test sequence compaction techniques are proposed in which the test sequence generated by the time expansion model has two characteristics: (1) The test sequ