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Highly Efficient Test Response Compaction Using a Hierarchical X-Masking Technique

✍ Scribed by Rabenalt, T.; Richter, M.; Poehl, F.; Goessel, M.

Book ID: 117908590
Publisher: IEEE
Year: 2012
Tongue: English
Weight: 338 KB
Volume: 31
Category: Article
ISSN: 0278-0070
DOI: 10.1109/tcad.2011.2181847

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